Four Circle X-ray Diffractometer (XRD)
Rapid structural characterization of epitaxial thin films is available on-site with a Panalytical Empyrean four circle X-ray diffractometer (XRD), offering high-intensity θ-2θ scans, rocking curves, and a 2-D pixel detector for reciprocal space maps (RSMs). XRD provides critical feedback of phase purity, film thickness, and structural information to aid in optimizing thin film growth parameters in the MBE
Example XRD Data: Ruf, J.P., Paik, H., Schreiber, N.J. et al. Strain-stabilized superconductivity. Nat Commun12, 59 (2021). https://doi.org/10.1038/s41467-020-20252-7
Sample Publications Using this Instrument
J.P. Ruf, H. Paik, N.J. Schreiber, H.P. Nair, L. Miao, J.K. Kawasaki, J.N. Nelson, B.D. Faeth, Y. Lee, B.H. Goodge, B. Pamuk, C.J. Fennie, L.F. Kourkoutis, D.G. Schlom, and K.M. Shen, “Strain-Stabilized Superconductivity,” Nat. Commun. 12, 59 (2021) and Highlight #36.
S. Chae, H. Paik, N.M. Vu, E. Kioupakis, and J.T. Heron, “Epitaxial Stabilization of Rutile Germanium Oxide Thin Film by Molecular Beam Epitaxy,” Appl. Phys. Lett. 117, 072105 (2020) and Highlight #32.
A. Bhargava, R. Eppstein, J. Sun, M.A. Smeaton, H. Paik, L.F. Kourkoutis, D.G. Schlom, M. Caspary Toroker, and R.D. Robinson, "Breakdown of the Small-Polaron Hopping Model in Higher-Order Spinels," Adv. Mater. 32, 2004490 (2020) and Highlight #30.
